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Wirtz T, Fleming Y, Gerard M, et al. Design and performance of a combined secondary ion mass spectrometry-scanning probe microscopy instrument for high sensitivity and high-resolution elemental three-dimensional analysis. Rev Sci Instrum. 2012;83(6):063702doi: 10.1063/1.4724308.
Wirtz, T., Fleming, Y., Gerard, M., Gysin, U., Glatzel, T., Meyer, E., Wegmann, U., Maier, U., Odriozola, A. H., & Uehli, D. (2012). Design and performance of a combined secondary ion mass spectrometry-scanning probe microscopy instrument for high sensitivity and high-resolution elemental three-dimensional analysis. The Review of scientific instruments, 83(6), 063702. https://doi.org/10.1063/1.4724308
Wirtz, Tom, et al. "Design and performance of a combined secondary ion mass spectrometry-scanning probe microscopy instrument for high sensitivity and high-resolution elemental three-dimensional analysis." The Review of scientific instruments vol. 83,6 (2012): 063702. doi: https://doi.org/10.1063/1.4724308
Wirtz T, Fleming Y, Gerard M, Gysin U, Glatzel T, Meyer E, Wegmann U, Maier U, Odriozola AH, Uehli D. Design and performance of a combined secondary ion mass spectrometry-scanning probe microscopy instrument for high sensitivity and high-resolution elemental three-dimensional analysis. Rev Sci Instrum. 2012 Jun;83(6):063702. doi: 10.1063/1.4724308. PMID: 22755629.
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