Cite
Gribelyuk MA, McCartney MR, Li J, et al. Mapping of electrostatic potential in deep submicron CMOS devices by electron holography. Phys Rev Lett. 2002;89(2):025502doi: 10.1103/PhysRevLett.89.025502.
Gribelyuk, M. A., McCartney, M. R., Li, J., Murthy, C. S., Ronsheim, P., Doris, B., McMurray, J. S., Hegde, S., & Smith, D. J. (2002). Mapping of electrostatic potential in deep submicron CMOS devices by electron holography. Physical review letters, 89(2), 025502. https://doi.org/10.1103/PhysRevLett.89.025502
Gribelyuk, M A, et al. "Mapping of electrostatic potential in deep submicron CMOS devices by electron holography." Physical review letters vol. 89,2 (2002): 025502. doi: https://doi.org/10.1103/PhysRevLett.89.025502
Gribelyuk MA, McCartney MR, Li J, Murthy CS, Ronsheim P, Doris B, McMurray JS, Hegde S, Smith DJ. Mapping of electrostatic potential in deep submicron CMOS devices by electron holography. Phys Rev Lett. 2002 Jul 08;89(2):025502. doi: 10.1103/PhysRevLett.89.025502. Epub 2002 Jun 19. PMID: 12097001.
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