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Caria G, Urquijo P, Adachi I, et al. Measurement of R(D) and R(D^{*}) with a Semileptonic Tagging Method. Phys Rev Lett. 2020;124(16):161803doi: 10.1103/PhysRevLett.124.161803.
Caria, G., Urquijo, P., Adachi, I., Aihara, H., Al Said, S., Asner, D. M., Atmacan, H., Aushev, T., Babu, V., Badhrees, I., Bahinipati, S., Bakich, A. M., Behera, P., Beleño, C., Bennett, J., Bhuyan, B., Bilka, T., Biswal, J., Bozek, A., Bračko, M., Browder, T. E., Campajola, M., Červenkov, D., Chang, P., Cheaib, R., Chekelian, V., Chen, A., Cheon, B. G., Chilikin, K., Cho, H. E., Cho, K., Choi, Y., Choudhury, S., Cinabro, D., Cunliffe, S., Dash, N., De Nardo, G., Di Capua, F., Di Carlo, S., Doležal, Z., Dong, T. V., Eidelman, S., Epifanov, D., Fast, J. E., Ferber, T., Ferlewicz, D., Fulsom, B. G., Garg, R., Gaur, V., Gabyshev, N., Garmash, A., Giri, A., Goldenzweig, P., Greenwald, D., Grzymkowska, O., Guan, Y., Hartbrich, O., Hayasaka, K., Hayashii, H., Higuchi, T., Hou, W. S., Hsu, C. L., Iijima, T., Inami, K., Inguglia, G., Ishikawa, A., Itoh, R., Iwasaki, M., Iwasaki, Y., Jacobs, W. W., Jeon, H. B., Jia, S., Jin, Y., Joffe, D., Joo, K. K., Kaliyar, A. B., Kang, K. H., Karyan, G., Kawasaki, T., Kichimi, H., Kim, C. H., Kim, D. Y., Kim, H. J., Kim, K. T., Kim, S. H., Kinoshita, K., Kodyš, P., Korpar, S., Kotchetkov, D., Križan, P., Kroeger, R., Krohn, J. F., Krokovny, P., Kuhr, T., Kumar, R., Kwon, Y. J., Lange, J. S., Lee, I. S., Lee, J. K., Lee, S. C., Li, L. K., Li, Y. B., Li Gioi, L., Libby, J., Lieret, K., Liventsev, D., Luo, T., MacQueen, C., Masuda, M., Matsuda, T., Matvienko, D., Merola, M., Metzner, F., Miyabayashi, K., Mohanty, G. B., Moon, T. J., Mori, T., Mussa, R., Nakamura, K. R., Nakao, M., Nath, K. J., Nayak, M., Nisar, N. K., Nishida, S., Nishimura, K., Ogawa, K., Ono, H., Onuki, Y., Oskin, P., Pakhlov, P., Pakhlova, G., Pal, B., Pang, T., Park, H., Park, S. H., Patra, S., Paul, S., Pedlar, T. K., Pestotnik, R., Piilonen, L. E., Popov, V., Prencipe, E., Prim, M. T., Rabusov, A., Resmi, P. K., Ritter, M., Rozanska, M., Russo, G., Sahoo, D., Sakai, Y., Sandilya, S., Santelj, L., Sanuki, T., Savinov, V., Schneider, O., Schnell, G., Schueler, J., Schwanda, C., Schwartz, A. J., Seino, Y., Senyo, K., Sevior, M. E., Shebalin, V., Shiu, J. G., Shwartz, B., Simon, F., Sokolov, A., Solovieva, E., Starič, M., Stottler, Z. S., Sumiyoshi, T., Sutcliffe, W., Takizawa, M., Tamponi, U., Tanida, K., Tenchini, F., Trabelsi, K., Uchida, M., Uglov, T., Uno, S., Usov, Y., Vahsen, S. E., Van Tonder, R., Varner, G., Varvell, K. E., Vossen, A., Waheed, E., Wang, B., Wang, C. H., Wang, M. Z., Wang, P., Wang, X. L., Watanuki, S., Wiechczynski, J., Won, E., Yamamoto, H., Yang, S. B., Ye, H., Yin, J. H., Yuan, C. Z., Zhang, Z. P., Zhilich, V., Zhukova, V., Zhulanov, V. (2020). Measurement of R(D) and R(D^{*}) with a Semileptonic Tagging Method. Physical review letters, 124(16), 161803. https://doi.org/10.1103/PhysRevLett.124.161803
Caria, G, et al. "Measurement of R(D) and R(D^{*}) with a Semileptonic Tagging Method." Physical review letters vol. 124,16 (2020): 161803. doi: https://doi.org/10.1103/PhysRevLett.124.161803
Caria G, Urquijo P, Adachi I, Aihara H, Al Said S, Asner DM, Atmacan H, Aushev T, Babu V, Badhrees I, Bahinipati S, Bakich AM, Behera P, Beleño C, Bennett J, Bhuyan B, Bilka T, Biswal J, Bozek A, Bračko M, Browder TE, Campajola M, Červenkov D, Chang P, Cheaib R, Chekelian V, Chen A, Cheon BG, Chilikin K, Cho HE, Cho K, Choi Y, Choudhury S, Cinabro D, Cunliffe S, Dash N, De Nardo G, Di Capua F, Di Carlo S, Doležal Z, Dong TV, Eidelman S, Epifanov D, Fast JE, Ferber T, Ferlewicz D, Fulsom BG, Garg R, Gaur V, Gabyshev N, Garmash A, Giri A, Goldenzweig P, Greenwald D, Grzymkowska O, Guan Y, Hartbrich O, Hayasaka K, Hayashii H, Higuchi T, Hou WS, Hsu CL, Iijima T, Inami K, Inguglia G, Ishikawa A, Itoh R, Iwasaki M, Iwasaki Y, Jacobs WW, Jeon HB, Jia S, Jin Y, Joffe D, Joo KK, Kaliyar AB, Kang KH, Karyan G, Kawasaki T, Kichimi H, Kim CH, Kim DY, Kim HJ, Kim KT, Kim SH, Kinoshita K, Kodyš P, Korpar S, Kotchetkov D, Križan P, Kroeger R, Krohn JF, Krokovny P, Kuhr T, Kumar R, Kwon YJ, Lange JS, Lee IS, Lee JK, Lee SC, Li LK, Li YB, Li Gioi L, Libby J, Lieret K, Liventsev D, Luo T, MacQueen C, Masuda M, Matsuda T, Matvienko D, Merola M, Metzner F, Miyabayashi K, Mohanty GB, Moon TJ, Mori T, Mussa R, Nakamura KR, Nakao M, Nath KJ, Nayak M, Nisar NK, Nishida S, Nishimura K, Ogawa K, Ono H, Onuki Y, Oskin P, Pakhlov P, Pakhlova G, Pal B, Pang T, Park H, Park SH, Patra S, Paul S, Pedlar TK, Pestotnik R, Piilonen LE, Popov V, Prencipe E, Prim MT, Rabusov A, Resmi PK, Ritter M, Rozanska M, Russo G, Sahoo D, Sakai Y, Sandilya S, Santelj L, Sanuki T, Savinov V, Schneider O, Schnell G, Schueler J, Schwanda C, Schwartz AJ, Seino Y, Senyo K, Sevior ME, Shebalin V, Shiu JG, Shwartz B, Simon F, Sokolov A, Solovieva E, Starič M, Stottler ZS, Sumiyoshi T, Sutcliffe W, Takizawa M, Tamponi U, Tanida K, Tenchini F, Trabelsi K, Uchida M, Uglov T, Uno S, Usov Y, Vahsen SE, Van Tonder R, Varner G, Varvell KE, Vossen A, Waheed E, Wang B, Wang CH, Wang MZ, Wang P, Wang XL, Watanuki S, Wiechczynski J, Won E, Yamamoto H, Yang SB, Ye H, Yin JH, Yuan CZ, Zhang ZP, Zhilich V, Zhukova V, Zhulanov V. Measurement of R(D) and R(D^{*}) with a Semileptonic Tagging Method. Phys Rev Lett. 2020 Apr 24;124(16):161803. doi: 10.1103/PhysRevLett.124.161803. PMID: 32383937.
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