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Anzai H, Suzuki M, Nagashima K, et al. True Vapor-Liquid-Solid Process Suppresses Unintentional Carrier Doping of Single Crystalline Metal Oxide Nanowires. Nano Lett. 2017;17(8):4698-4705doi: 10.1021/acs.nanolett.7b01362.
Anzai, H., Suzuki, M., Nagashima, K., Kanai, M., Zhu, Z., He, Y., Boudot, M., Zhang, G., Takahashi, T., Kanemoto, K., Seki, T., Shibata, N., & Yanagida, T. (2017). True Vapor-Liquid-Solid Process Suppresses Unintentional Carrier Doping of Single Crystalline Metal Oxide Nanowires. Nano letters, 17(8), 4698-4705. https://doi.org/10.1021/acs.nanolett.7b01362
Anzai, Hiroshi, et al. "True Vapor-Liquid-Solid Process Suppresses Unintentional Carrier Doping of Single Crystalline Metal Oxide Nanowires." Nano letters vol. 17,8 (2017): 4698-4705. doi: https://doi.org/10.1021/acs.nanolett.7b01362
Anzai H, Suzuki M, Nagashima K, Kanai M, Zhu Z, He Y, Boudot M, Zhang G, Takahashi T, Kanemoto K, Seki T, Shibata N, Yanagida T. True Vapor-Liquid-Solid Process Suppresses Unintentional Carrier Doping of Single Crystalline Metal Oxide Nanowires. Nano Lett. 2017 Aug 09;17(8):4698-4705. doi: 10.1021/acs.nanolett.7b01362. Epub 2017 Jul 07. PMID: 28671477.
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