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Product Inspection Methodology via Deep Learning: An Overview.

Sensors (Basel, Switzerland)

Kim TH, Kim HR, Cho YJ.
PMID: 34372276
Sensors (Basel). 2021 Jul 25;21(15). doi: 10.3390/s21155039.

In this study, we present a framework for product quality inspection based on deep learning techniques. First, we categorize several deep learning models that can be applied to product inspection systems. In addition, we explain the steps for building...

Cite
Kim TH, Kim HR, Cho YJ. Product Inspection Methodology via Deep Learning: An Overview. Sensors (Basel). 2021;21(15)doi: 10.3390/s21155039.
Kim, T. H., Kim, H. R., & Cho, Y. J. (2021). Product Inspection Methodology via Deep Learning: An Overview. Sensors (Basel, Switzerland), 21(15), . https://doi.org/10.3390/s21155039
Kim, Tae-Hyun, et al. "Product Inspection Methodology via Deep Learning: An Overview." Sensors (Basel, Switzerland) vol. 21,15 (2021). doi: https://doi.org/10.3390/s21155039
Kim TH, Kim HR, Cho YJ. Product Inspection Methodology via Deep Learning: An Overview. Sensors (Basel). 2021 Jul 25;21(15). doi: 10.3390/s21155039. PMID: 34372276; PMCID: PMC8346960.
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Scientists worry about some risks more than the public.

Nature nanotechnology

Scheufele DA, Corley EA, Dunwoody S, Shih TJ, Hillback E, Guston DH.
PMID: 18654416
Nat Nanotechnol. 2007 Dec;2(12):732-4. doi: 10.1038/nnano.2007.392. Epub 2007 Nov 25.

No abstract available.

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Scheufele DA, Corley EA, Dunwoody S, et al. Scientists worry about some risks more than the public. Nat Nanotechnol. 2007;2(12):732-4doi: 10.1038/nnano.2007.392.
Scheufele, D. A., Corley, E. A., Dunwoody, S., Shih, T. J., Hillback, E., & Guston, D. H. (2007). Scientists worry about some risks more than the public. Nature nanotechnology, 2(12), 732-4. https://doi.org/10.1038/nnano.2007.392
Scheufele, Dietram A, et al. "Scientists worry about some risks more than the public." Nature nanotechnology vol. 2,12 (2007): 732-4. doi: https://doi.org/10.1038/nnano.2007.392
Scheufele DA, Corley EA, Dunwoody S, Shih TJ, Hillback E, Guston DH. Scientists worry about some risks more than the public. Nat Nanotechnol. 2007 Dec;2(12):732-4. doi: 10.1038/nnano.2007.392. Epub 2007 Nov 25. PMID: 18654416.
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Indefinite particles.

Nature nanotechnology

Toumey C.
PMID: 18654552
Nat Nanotechnol. 2008 Jul;3(7):372-3. doi: 10.1038/nnano.2008.196.

No abstract available.

Cite
Toumey C. Indefinite particles. Nat Nanotechnol. 2008;3(7):372-3doi: 10.1038/nnano.2008.196.
Toumey, C. (2008). Indefinite particles. Nature nanotechnology, 3(7), 372-3. https://doi.org/10.1038/nnano.2008.196
Toumey, Chris. "Indefinite particles." Nature nanotechnology vol. 3,7 (2008): 372-3. doi: https://doi.org/10.1038/nnano.2008.196
Toumey C. Indefinite particles. Nat Nanotechnol. 2008 Jul;3(7):372-3. doi: 10.1038/nnano.2008.196. PMID: 18654552.
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Application of modelling in HACCP plan development.

International journal of food microbiology

Baker DA.
PMID: 7654511
Int J Food Microbiol. 1995 May;25(3):251-61. doi: 10.1016/0168-1605(95)00143-8.

Incorporating Hazard Analysis Critical Control Points (HACCP) in the initial stages of food product development allows for an assessment of the risk and severity of hazards, which may be associated with the raw materials used, their processing, the system...

Cite
Baker DA. Application of modelling in HACCP plan development. Int J Food Microbiol. 1995;25(3):251-61doi: 10.1016/0168-1605(95)00143-8.
Baker, D. A. (1995). Application of modelling in HACCP plan development. International journal of food microbiology, 25(3), 251-61. https://doi.org/10.1016/0168-1605(95)00143-8
Baker, D A. "Application of modelling in HACCP plan development." International journal of food microbiology vol. 25,3 (1995): 251-61. doi: https://doi.org/10.1016/0168-1605(95)00143-8
Baker DA. Application of modelling in HACCP plan development. Int J Food Microbiol. 1995 May;25(3):251-61. doi: 10.1016/0168-1605(95)00143-8. PMID: 7654511.
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Showing 1 to 4 of 4 entries